Shenzhen YCIC electronics co., LTD is committed to 100% customer satisfaction by maintaining optimal quality processes and procedures based on our ISO 9001. Shenzhen YCIC electronics co., LTD have its own QC team,we provide a three-stage verification and quality inspection process for all components.can monitor and control the quality during the whole process including in-coming, storage, and delivery and etc.

Contracted with the global authorities third party testing house,by using the most advance testing machine and the latest technologies to ensure our quality.

• Visual Inspection
• X-ray Inspection
• Marking Permanency Test
• De-capsulation Test
• Pin Assignment Test
• PB Free / RoHS Test
• Electrical Test
• Functional Test

External Visual Inspection (EVI)

The first, and most essential, step for any component evaluation is a thorough inspection process.

Our procedure and acceptance standards have been developed in order to detect and report evidence of remarking, resurfacing, and refurbishing.

Marking permanency and resistance to solvents, resurfacing, dimension verification, marking code matching,

high-power magnification inspection of body and terminal condition are standard methods within our inspection process.

All inspections and observations are reviewed by Quality Engineers to evaluate whether we are seeing a new counterfeiting technique or a manufacturing anomaly.

Radiography (X-ray)

Inspection and analysis of a component to examine hardware integrity and variations between devices within a population.

Not all variations, however, mean a counterfeit device. Understanding the manufacturing process and how manufacturer supplychains and engineering controls operate, we can identify when variations are manufacturing-based rather than indicators of counterfeiting.

X-ray system is real-time and can rotate the object on all three axes for outstanding imaging capability and analysis of individual components and assembled boards.

Decapsulation

A destructive test that removes the insulation material of the component to reveal the die.

The die is then analyzed for markings and architecture to determine traceability and authenticity of the device.

Magnification power of up to 1,000x is necessary to identify die markings and surface anamolies.

X-ray Flouresence (XRF) Material Analysis

The spectrometer is used for measuring the controlled elements in lead-free and RoHS compliant devices and determining the composition of plating materials.

We also use this equipment for helping to detect reconditioned and resurfaced parts by measuring the plating thickness and variations in the composition of the surface material.